Showing results 1 to 4 of 4
Density functional calculations of the Schottky barrier height and effective work function in Ni/oxide interfaces Noh, HK; Oh, YJ; Chang, Kee-Joo, 2012 APS March Meeting, APS, 2012-02 |
Electronic structure of O-vacancy in high-k dielectrics and oxide semiconductors Chang, Kee-Joo; Noh, HK; Oh, YJ, MRS Spring, Moscone West and San Francisco Marriott, MRS, 2011-04 |
Segregation and diffusion of boron dopants in the Si/SiO2 interface Oh, YJ; Noh, HK; Kim, GM; Chang, Kee-Joo, 2012 APS March Meeting, APS, 2012-02 |
The electronic structure of lithium silicides Chang, Kee-Joo; Oh, YJ; Ryu, B., The 12th Asian workshop on First-principles Electronic Structure Calculations, 2009-10 |
Discover