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Intra-unit-cell electronic nematicity of the high-T(c) copper-oxide pseudogap states Lawler, M. J.; Fujita, K.; Lee, Jhinhwan; Schmidt, A. R.; Kohsaka, Y.; Kim, Chung Koo; Eisaki, H.; et al, NATURE, v.466, no.7304, pp.347 - 351, 2010-07 |
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