Showing results 8 to 13 of 13
Spontaneous emission factor of oxidized VCSELs from the measured below-threshold cavity loss Shin, JH; Kim, JH; Ju, YG; Shin, HE; Lee, Yong-Hee, CLEO '97, CLEO, 1997 |
Spontaneous emission factor of oxidized vertical-cavity surface-emitting lasers from the measured below-threshold cavity loss Shin, JH; Ju, YG; Shin, HE; Lee, Yong-Hee, APPLIED PHYSICS LETTERS, v.70, no.18, pp.2344 - 2346, 1997-05 |
Strong polarization selectivity in 780-nm vertical-cavity surface-emitting lasers grown on misoriented substrates Ju, YG; Lee, Yong-Hee; Shin, HK; Kim, I, Proceedings of the 1997 10th IEEE Lasers and Electro-Optics Society Annual Meeting, LEOS. Part 2 (of 2), v.2, pp.291 - 292, IEEE, 1997-11-10 |
Strong polarization selectivity in 780-nm vertical-cavity surface-emitting lasers grown on misoriented substrates Ju, YG; Lee, Yong-Hee; Shin, HK; Kim, I, APPLIED PHYSICS LETTERS, v.71, no.6, pp.741 - 743, 1997-08 |
Transverse mode control by etch-depth tuning in 1120-nm GaInAs/GaAs photonic crystal Baek, JH; Song, DS; Hwang, IK; Lee, KH; Lee, Yong-Hee; Ju, YG; Kondo, T; et al, OPTICS EXPRESS, v.12, pp.859 - 867, 2004-03 |
Ultralow threshold current 780-nm vertical-cavity surface-emitting lasers with oxide current aperture Shin, HY; Ju, YG; Lee, Yong-Hee, CLEO 96, pp.0 - 0, CLEO, 1996-06-01 |
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