A New Evaluation of the Activation Energy for Interface State Generation due to Hot-Carrier Effects
| DC Field | Value | Language |
|---|---|---|
| dc.contributor.author | Lee, Kwyro | - |
| dc.contributor.author | Kim, Shi-Ho | - |
| dc.contributor.author | Min, Kyeong-Sik | - |
| dc.date.accessioned | 2013-03-14T13:30:59Z | - |
| dc.date.available | 2013-03-14T13:30:59Z | - |
| dc.date.created | 2012-02-06 | - |
| dc.date.issued | 1993 | - |
| dc.identifier.citation | Technical Digest of 3rd International Conference on VLSI and CAD, v., no., pp.90 - 92 | - |
| dc.identifier.uri | http://hdl.handle.net/10203/109211 | - |
| dc.language | ENG | - |
| dc.title | A New Evaluation of the Activation Energy for Interface State Generation due to Hot-Carrier Effects | - |
| dc.type | Conference | - |
| dc.type.rims | CONF | - |
| dc.citation.beginningpage | 90 | - |
| dc.citation.endingpage | 92 | - |
| dc.citation.publicationname | Technical Digest of 3rd International Conference on VLSI and CAD | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.identifier.conferencecountry | South Korea | - |
| dc.contributor.localauthor | Lee, Kwyro | - |
| dc.contributor.nonIdAuthor | Kim, Shi-Ho | - |
| dc.contributor.nonIdAuthor | Min, Kyeong-Sik | - |
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