DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Ho Gi | - |
dc.date.accessioned | 2013-03-14T06:58:07Z | - |
dc.date.available | 2013-03-14T06:58:07Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1986 | - |
dc.identifier.citation | 2nd Intern. Confer. on Conduction and Breakdown,IEEE Soc. (West Germany), v., no., pp.7 - 10 | - |
dc.identifier.uri | http://hdl.handle.net/10203/106341 | - |
dc.language | ENG | - |
dc.title | Effects of Microstructure on the Dielectric Breakdown of BaTiO3 Ceramics | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 7 | - |
dc.citation.endingpage | 10 | - |
dc.citation.publicationname | 2nd Intern. Confer. on Conduction and Breakdown,IEEE Soc. (West Germany) | - |
dc.contributor.localauthor | Kim, Ho Gi | - |
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