DC Field | Value | Language |
---|---|---|
dc.contributor.author | Park, H.G. | - |
dc.contributor.author | Kim, Seung-Woo | - |
dc.date.accessioned | 2013-03-14T03:44:27Z | - |
dc.date.available | 2013-03-14T03:44:27Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 1991-11 | - |
dc.identifier.citation | Proc. of CIRP Conf. on Precision Engineering and Manufacturing Systems, v., no., pp.163 - 172 | - |
dc.identifier.uri | http://hdl.handle.net/10203/104928 | - |
dc.language | ENG | - |
dc.title | 3-Dimensional Measurement of Surface Profile by Moire Topography | - |
dc.type | Conference | - |
dc.type.rims | CONF | - |
dc.citation.beginningpage | 163 | - |
dc.citation.endingpage | 172 | - |
dc.citation.publicationname | Proc. of CIRP Conf. on Precision Engineering and Manufacturing Systems | - |
dc.identifier.conferencecountry | China | - |
dc.identifier.conferencecountry | China | - |
dc.contributor.localauthor | Kim, Seung-Woo | - |
dc.contributor.nonIdAuthor | Park, H.G. | - |
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