Industrial X-ray imaging based on scintillators and CMOS APS array: direct X-ray irradiation effects

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To see the effects of the direct X-ray in a Lanex screen-coupled CMOS APS imager, we measured modulation transfer function (MTF), noise power spectrum (NPS), and detective quantum efficiency (DQE). These measurements were performed under the condition of non-destructive test (NDT). By increasing the cumulative exposure on the imager, the MTF was degraded, and also leading to the DQE degradation. Each parameter changed by the exposure is described in detail. (C) 2004 Elsevier B.V. All rights reserved.
Publisher
ELSEVIER SCIENCE BV
Issue Date
2005-01
Language
English
Article Type
Article; Proceedings Paper
Citation

NUCLEAR INSTRUMENTS METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, v.537, no.1-2, pp.454 - 457

ISSN
0168-9002
URI
http://hdl.handle.net/10203/10235
Appears in Collection
NE-Journal Papers(저널논문)
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