Sequential recognition of superimposed patterns with top-down selective attention

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dc.contributor.authorKim, BTko
dc.contributor.authorLee, Soo-Youngko
dc.date.accessioned2009-07-23T02:57:10Z-
dc.date.available2009-07-23T02:57:10Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2004-06-
dc.identifier.citationNEUROCOMPUTING, v.58, pp.633 - 640-
dc.identifier.issn0925-2312-
dc.identifier.urihttp://hdl.handle.net/10203/10221-
dc.description.abstractTop-down attention is a cognitive mechanism to filter out irrelevant information from sensory input. Unlike bottom-up attention based on the sensory signal itself the top-down attention process is originated from the higher brain, which consists of previous knowledge about the sensory signals. A simple computational model is developed for the top-down attention. In this model an attention gain coefficient is assigned to each input feature, and all the attention gain coefficients are dynamically adjusted based on previous knowledge. A multilayer Perceptron is used to model the knowledge in the higher brain. The developed model demonstrates excellent capability of extracting and recognizing each pattern sequentially from superimposed dual-class patterns studied in visual perception. (C) 2004 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.language.isoen_USen
dc.publisherELSEVIER SCIENCE BV-
dc.titleSequential recognition of superimposed patterns with top-down selective attention-
dc.typeArticle-
dc.identifier.wosid000222245900094-
dc.identifier.scopusid2-s2.0-2542474280-
dc.type.rimsART-
dc.citation.volume58-
dc.citation.beginningpage633-
dc.citation.endingpage640-
dc.citation.publicationnameNEUROCOMPUTING-
dc.embargo.liftdate9999-12-31-
dc.embargo.terms9999-12-31-
dc.contributor.localauthorLee, Soo-Young-
dc.contributor.nonIdAuthorKim, BT-
dc.type.journalArticleArticle; Proceedings Paper-
dc.subject.keywordAuthorselective attention-
dc.subject.keywordAuthorsuperimposed patterns-
dc.subject.keywordAuthordual-class patterns-
dc.subject.keywordAuthortop-down expectation-
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