DC Field | Value | Language |
---|---|---|
dc.contributor.author | Kim, Dong-Soo | ko |
dc.contributor.author | Kwon, Il-Woong | ko |
dc.contributor.author | Lee, Yong-Soo | ko |
dc.contributor.author | Lee, Hee-Chul | ko |
dc.date.accessioned | 2013-03-12T02:24:07Z | - |
dc.date.available | 2013-03-12T02:24:07Z | - |
dc.date.created | 2012-02-06 | - |
dc.date.created | 2012-02-06 | - |
dc.date.issued | 2011-01 | - |
dc.identifier.citation | INFRARED PHYSICS TECHNOLOGY, v.54, no.1, pp.10 - 12 | - |
dc.identifier.issn | 1350-4495 | - |
dc.identifier.uri | http://hdl.handle.net/10203/101081 | - |
dc.description.abstract | The resistivity of nano-scaled thin nickel film can be controlled so as to be applicable to MEMS-based micro-bolometric infrared image sensor technology. DC-sputtered 60 nm-thick thin nickel film on a SiO(2)/Si substrate was oxidized in O(2) ambient. From XRD and electrical analyses, a phase transformation from the metallic nickel film to crystalline nickel oxide films was verified. The thin oxidized nickel films showed a negative TCR (temperature coefficient of resistance (above -3.22%/degrees C)) which is indicative of a semiconductor behavior. A 1/f noise result ranging from 1 Hz to 100 Hz was also acquired. (C) 2010 Elsevier B.V. All rights reserved. | - |
dc.language | English | - |
dc.publisher | ELSEVIER SCIENCE BV | - |
dc.title | The bolometric characteristic of thermally oxidized thin nickel film for an uncooled infrared image sensor | - |
dc.type | Article | - |
dc.identifier.wosid | 000286860100002 | - |
dc.identifier.scopusid | 2-s2.0-78650600364 | - |
dc.type.rims | ART | - |
dc.citation.volume | 54 | - |
dc.citation.issue | 1 | - |
dc.citation.beginningpage | 10 | - |
dc.citation.endingpage | 12 | - |
dc.citation.publicationname | INFRARED PHYSICS TECHNOLOGY | - |
dc.identifier.doi | 10.1016/j.infrared.2010.10.001 | - |
dc.embargo.liftdate | 9999-12-31 | - |
dc.embargo.terms | 9999-12-31 | - |
dc.contributor.localauthor | Lee, Hee-Chul | - |
dc.contributor.nonIdAuthor | Lee, Yong-Soo | - |
dc.type.journalArticle | Article | - |
dc.subject.keywordAuthor | Bolometric material | - |
dc.subject.keywordAuthor | Micro-bolometer | - |
dc.subject.keywordAuthor | Nickel oxide | - |
dc.subject.keywordAuthor | TCR | - |
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