Thermistor behavior of PEDOT:PSS thin film

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dc.contributor.authorKwon, Il-Woongko
dc.contributor.authorSon, Hyuck-Junko
dc.contributor.authorKim, Woo-Youngko
dc.contributor.authorLee, Yong-Sooko
dc.contributor.authorLee, Hee-Chulko
dc.date.accessioned2013-03-12T02:23:14Z-
dc.date.available2013-03-12T02:23:14Z-
dc.date.created2012-02-06-
dc.date.created2012-02-06-
dc.date.issued2009-06-
dc.identifier.citationSYNTHETIC METALS, v.159, no.12, pp.1174 - 1177-
dc.identifier.issn0379-6779-
dc.identifier.urihttp://hdl.handle.net/10203/101079-
dc.description.abstractThe temperature-dependent resistance changing characteristics (thermistor behaviors) of a poly(3,4-ethylenedioxythophene):poly(4-styrenesulfonate) (PEDOT:PSS) thin film are investigated in the 30-100 degrees C range using Greek-cross and bar patterns. The PEDOT:PSS film was spin-coated onto a Si wafer passivated with a SiO(2) layer, and a conventional dry etching technique was used to pattern the PEDOT:PSS film in conjunction with a nitride etch mask layer. Cr/Au was used for the electrode material. It was found that the characteristic temperature (T(o)) and resistivity of the PEDOT:PSS film have an inversely proportional relationship with the number of coatings and the number of interfaces between multiply coated PEDOT:PSS layers. It was also found that as the number of coatings and the number of the interfaces increase, lower temperature-dependent resistance changes are observed. The temperature coefficient of resistance (TCR) value of 60 nm thick PEDOT:PSS film was slightly larger than or comparable to that of a conventional metal (Au or Pt) thermistor. The possibility of utilizing the PEDOT:PSS thin film in thermistor applications is discussed. (C) 2009 Elsevier B.V. All rights reserved.-
dc.languageEnglish-
dc.publisherELSEVIER SCIENCE SA-
dc.subjectCONDUCTIVITY-
dc.subjectPOLY(3,4-ETHYLENEDIOXYTHIOPHENE)/POLY(4-STYRENE-SULFONATE)-
dc.subjectENHANCEMENT-
dc.subjectMORPHOLOGY-
dc.subjectSUBSTRATE-
dc.subjectTRANSPORT-
dc.subjectSOLVENT-
dc.titleThermistor behavior of PEDOT:PSS thin film-
dc.typeArticle-
dc.identifier.wosid000267838700010-
dc.identifier.scopusid2-s2.0-67349285095-
dc.type.rimsART-
dc.citation.volume159-
dc.citation.issue12-
dc.citation.beginningpage1174-
dc.citation.endingpage1177-
dc.citation.publicationnameSYNTHETIC METALS-
dc.identifier.doi10.1016/j.synthmet.2009.02.006-
dc.contributor.localauthorLee, Hee-Chul-
dc.contributor.nonIdAuthorLee, Yong-Soo-
dc.type.journalArticleArticle-
dc.subject.keywordAuthorPoly(3,4-ethylenedioxythiophene):poly(styrenesulfonate) (PEDOT:PSS)-
dc.subject.keywordAuthorThermistor-
dc.subject.keywordPlusCONDUCTIVITY-
dc.subject.keywordPlusPOLY(3,4-ETHYLENEDIOXYTHIOPHENE)/POLY(4-STYRENE-SULFONATE)-
dc.subject.keywordPlusENHANCEMENT-
dc.subject.keywordPlusMORPHOLOGY-
dc.subject.keywordPlusSUBSTRATE-
dc.subject.keywordPlusTRANSPORT-
dc.subject.keywordPlusSOLVENT-
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