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Results 1-9 of 9 (Search time: 0.003 seconds).
| NO | Title, Author(s) (Publication Title, Volume Issue, Page, Issue Date) |
|---|---|
| Evaluating CAVM: A new search-based test data generation tool for C Kim, Junhwi; You, Byeonghyeon; Kwon, Minhyuk; McMinn, Phil; Yoo, Shin, 9th International Symposium on Search-Based Software Engineering, SSBSE 2017, pp.143 - 149, Springer Verlag, 2017-09-11 | |
| Hyperheuristic observation based slicing of guava Lee, Seongmin; Yoo, Shin, 9th International Symposium on Search-Based Software Engineering, SSBSE 2017, pp.175 - 180, Springer Verlag, 2017-09-09 | |
| GPGPGPU: Evaluation of parallelisation of genetic programming using GPGPU Kim, Jinhan; Kim, Junhwi; Yoo, Shin, 9th International Symposium on Search-Based Software Engineering, SSBSE 2017, pp.137 - 142, Springer Verlag, 2017-09-10 | |
| Tree-oriented vs. line-oriented observation-based slicing Binkley, Dave; Gold, Nicolas; Islam, Syed; Krinke, Jens; Yoo, Shin, Source Code Analysis and Manipulation (SCAM), IEEE COMPUTER SOC, 2017-09-17 | |
| Empirical Evaluation of Conditional Operators in GP Based Fault Localization Dahyun Kang; Sohn, Jeong Ju; Yoo, Shin, Genetic and Evolutionary Computation Conference (GECCO), pp.1295 - 1302, ACM SIGEVO, 2017-07-15 | |
| Generalized Observational Slicing for Tree-Represented Modelling Languages Gold, Nicolas E.; Binkley, David; Harman, Mark; Islam, Syed; Krinke, Jens; Yoo, Shin, 11th Joint Meeting of European Software Engineering Conference (ESEC) / ACM SIGSOFT Symposium on the Foundations of Software Engineering (FSE), pp.547 - 558, ACM Special Interest Group on Software Engineering (SIGSOFT), 2017-09-08 | |
| FLUCCS: Using Code and Change Metrics to Improve Fault Localization Sohn, Jeongju; Yoo, Shin, 26th ACM SIGSOFT International Symposium on Software Testing and Analysis (ISSTA), pp.273 - 283, ACM Special Interest Group on Software Engineering (SIGSOFT), 2017-07-12 | |
| Embedding genetic improvement into programming languages Yoo, Shin, 2017 Genetic and Evolutionary Computation Conference Companion, GECCO 2017, pp.1551 - 1552, Association for Computing Machinery, Inc, 2017-07 | |
| Inferring automatic test oracles Langdon, William B.; Yoo, Shin; Harman, Mark, 10th IEEE/ACM International Workshop on Search-Based Software Testing, SBST 2017, pp.5 - 6, Institute of Electrical and Electronics Engineers Inc., 2017-05 |
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