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Repairing Fragile GUI Test Cases Using Word and Layout Embedding Yoon, Juyeon; Chung, Seungjoon; Shin, Kihyuck; Kim, Jinhan; Hong, Shin; Yoo, Shin, International Conference on Software Testing, Verification and Validation, ICST 2022, pp.291 - 301, Institute of Electrical and Electronics Engineers Inc., 2022-04-07 |
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