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Are Mutation Scores Correlated with Real Fault Detection? A Large Scale Empirical study on the Relationship Between Mutants and Real Faults

Papadakis, Mike; Shin, Donghwan; Yoo, Shin; Bae, Doo-Hwan, International Conference on Software Engineering, pp.537 - 548, IEEE Computer Society and ACM SIGSOFT, 2018-05-31

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