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Showing results 1 to 8 of 8

1
Ahead of Time Mutation Based Fault Localisation using Statistical Inference

Kim, Jinhan; An, Gabin; Feldt, Robert; Yoo, Shin, 2021 IEEE 32nd International Symposium on Software Reliability Engineering, ISSRE 2021, pp.253 - 263, IEEE, 2021-10-28

2
Flexible Probabilistic Modeling for Search Based Test Data Generation

Feldt, Robert; Yoo, Shin, ICSE '20: 42nd International Conference on Software Engineering, Association for Computing Machinery, Inc, 2020-06-27

3
Guiding Deep Learning System Testing Using Surprise Adequacy

Kim, Jinhan; Feldt, Robert; Yoo, Shin, 2019 IEEE/ACM 41st International Conference on Software Engineering (ICSE), pp.1039 - 1049, IEEE, 2019-05-31

4
Information transformation: An underpinning theory for software engineering

Clark, David; Feldt, Robert; Poulding, Simon; Yoo, Shin, International Conference on Software Engineering, pp.599 - 602, IEEE Computer Society and ACM SIGSOFT, 2015-05-20

5
MOAD: Modeling Observation-based Approximate Dependency

Lee, Seongmin; Binkley, David; Feldt, Robert; Gold, Nicolas; Yoo, Shin, IEEE International Conference on Source Code Analysis and Manipulation, pp.12 - 22, IEEE Computer Society, 2019-09-30

6
Reducing DNN labelling cost using surprise adequacy: an industrial case study for autonomous driving

Kim, Jinhan; Ju, Jeongil; Feldt, Robert; Yoo, Shin, ACM Joint Meeting on European Software Engineering Conference and Symposium on the Foundations of Software Engineering, pp.1466 - 1476, ACM SIGSOFT, 2020-11-10

7
SINVAD: Search-based Image Space Navigation for DNN Image Classifier Test Input Generation

Kang, Sungmin; Feldt, Robert; Yoo, Shin, 42nd IEEE/ACM International Conference on Software Engineering Workshops, ICSEW 2020, Association for Computing Machinery, Inc, 2020-06-27

8
Test Set Diameter: Quantifying the Diversity of Sets of Test Cases

Feldt, Robert; Poulding, Simon; Clark, David; Yoo, Shin, 9th IEEE International Conference on Software Testing, Verification and Validation, ICST 2016, pp.223 - 233, Institute of Electrical and Electronics Engineers Inc., 2016-04-14

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