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Showing results 5 to 8 of 8

5
FDG: a precise measurement of fault diagnosability gain of test cases

An, Gabin; Yoo, Shin, 31st ACM SIGSOFT International Symposium on Software Testing and Analysis, ISSTA '22, pp.14 - 26, ACM, 2022-07-20

6
Fonte: Finding Bug Inducing Commits from Failures

An, Gabin; Yoo, Shin; Hong, Jingun; Kim, Naryeong, 45th International Conference on Software Engineering, IEEE/ACM, 2023-05-17

7
Reducing the search space of bug inducing commits using failure coverage

An, Gabin; Yoo, Shin, European Software Engineering Conference and Symposium on the Foundations of Software Engineering (ESEC/FSE 2021), pp.1459 - 1462, ACM, 2021-08-25

8
Searching for Multi-fault Programs in Defects4J

An, Gabin; Yoon, Juyeon; Yoo, Shin, 13th International Symposium on Search Based Software Engineering, SSBSE 2021, pp.153 - 158, Springer International Publishing, 2021-10-11

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