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Showing results 174461 to 174480 of 275593

174461
Semi-markov reliability analysis of three test/repair policies in a standby safety system = 대기안전계통의 세가지 시험보수 정책에 대한 세마이-마코브 신뢰도 분석link

Jung, Woo-Sik; 정우식; et al, 한국과학기술원, 1989

174462
SEMI-MARKOV RELIABILITY-ANALYSIS OF 3 TEST REPAIR POLICIES FOR STANDBY SAFETY SYSTEMS IN A NUCLEAR-POWER-PLANT

JUNG, WS; Cho, Nam-Zin, RELIABILITY ENGINEERING SYSTEM SAFETY, v.31, no.1, pp.1 - 30, 1991

174463
SEMI-MARKOV RELIABILITY-ANALYSIS OF ALTERNATING SYSTEMS IN A NUCLEAR-POWER-PLANT

LEE, KN; Cho, Nam-Zin, NUCLEAR TECHNOLOGY, v.98, no.2, pp.230 - 241, 1992-05

174464
Semi-Metric Reconstruction from a Single Image Using Orthogonality and Parallelism

Kweon, In-So; Kim, Jun-sik, the 11th Korea-Japan Joint Workshop on Frontiers of Computer Vision, pp.115 - 120, 2005-01

174465
Semi-metric space: A new approach to treat orthogonality and parallelism

Kim, JS; Kweon, In-So, COMPUTER VISION - ACCV 2006, PT I BOOK SERIES: LECTURE NOTES IN COMPUTER SCIENCE, v.3851, pp.529 - 538, 2006

174466
Semi-metric Space: A New Approach to Treat Orthogonality and Parallelism

Kim, Jun-Sik; Kweon, In So, ACCV, 2006

174467
Semi-orthogonal frame wavelets and frame multi-resolution analyses

Kim, Hong Oh, BULLETIN OF THE AUSTRALIAN MATHEMATICAL SOCIETY, v.65, no.1, pp.35 - 44, 2002-01

174468
Semi-pilot Study of Electrokinetic Process for Phenanthrene Removal from Kaolinite

양지원, 한국지하수토양환경학회 2004년도 임시총회 및 추계학술발표회, pp.0 - 0, 한국지하수토양환경학회, 2004-09-01

174469
Semi-recursive VLSI architecture for two dimensional discrete wavelet transform

Pack, SK; Jeon, HK; Kim, Lee-Sup, Proceedings of the 1998 IEEE International Symposium on Circuits and Systems, ISCAS. Part 5 (of 6), pp.469 - 472, IEEE, 1998-05-31

174470
Semi-sequential 방법을 이용한 열교환망의 합성

박선원, KIChE Meeting, Spring, KIChE, 1999-01-01

174471
Semi-supervised active learning for 3D object detection using consistency based uncertainty = 일관성 기반 불확실성 추정을 사용한 3차원 객체검출 모델의 준지도 학습기반 능동학습 방법link

Hwang, Sihwan; Kum, Dongsuk; et al, 한국과학기술원, 2022

174472
Semi-supervised bearing fault diagnosis with adversarially trained phase-consistent network = 적대적 위상 일치 신경망을 사용한 준지도 베어링 이상 진단link

Yi, Jaehyuk; Park, Jinkyoo; et al, 한국과학기술원, 2021

174473
Semi-supervised Bearing Fault Diagnosis with Adversarially-Trained Phase-Consistent Network

Yi, Jaehyuk; Park, Jinkyoo, 27th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, KDD 2021, pp.3875 - 3885, Association for Computing Machinery, 2021-08

174474
Semi-supervised Botnet Detection Using Ant Colony Clustering

Huseynov, Khalid; Kim, Kwangjo; Yoo, Paul D., SCIS2014, v.0, The Institute of Electronics, Information and Communication Engineers (IEICE), 2014-01-22

174475
Semi-Supervised Domain Adaptation for End-to-End Automatic Speech Recognition

Jeong, Hyeonjae; Goo, Jahyun; Kim, Seunghi; Kim, Hoi-Rin, SICSS 2019, pp.134, Korean Society of Speech Sciences, 2019-11-15

174476
Semi-Supervised Domain Adaptation via Selective Pseudo Labeling and Progressive Self-Training

Kim, Yoonhyung; Kim, Changick, ICPR: International Conference on Pattern Recognition, pp.1059 - 1066, IEEE, 2021-01-15

174477
Semi-Supervised Gait Generation With Two Microfluidic Soft Sensors

Kim, Dooyoung; Kim, Min; Kwon, Junghan; Park, Yong-Lae; Jo, Sungho, IEEE Robotics and Automation Letters, v.4, no.3, pp.2501 - 2507, 2019-07

174478
Semi-Supervised Hyperspectral Object Detection Challenge Results

Rangnekar, Aneesh; Mulhollan, Zachary; Vodacek, Anthony; Hoffman, Matthew; Sappa, Angel; Blasch, Erik; Yu, Jun; et al, 18th IEEE Workshop on Perception Beyond the Visible Spectrum, pp.390 - 398, Perception Beyond the Visible Spectrum IEEE PBVS2022, 2022-06-19

174479
Semi-supervised learning for simultaneous location detection and classification of mixed-type defect patterns in wafer bin maps = 웨이퍼 혼합 결함 패턴의 위치 탐지와 분류를 위한 준지도 학습link

Lee, Jaehyun; Kim, Heeyoung; et al, 한국과학기술원, 2022

174480
Semi-Supervised Learning for Simultaneous Location Detection and Classification of Mixed-Type Defect Patterns in Wafer Bin Maps

Lee, Hyuck; Lee, Jaehyun; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.2, pp.220 - 230, 2023-05

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