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Showing results 174441 to 174460 of 275509

174441
Semi-metric Space: A New Approach to Treat Orthogonality and Parallelism

Kim, Jun-Sik; Kweon, In So, ACCV, 2006

174442
Semi-orthogonal frame wavelets and frame multi-resolution analyses

Kim, Hong Oh, BULLETIN OF THE AUSTRALIAN MATHEMATICAL SOCIETY, v.65, no.1, pp.35 - 44, 2002-01

174443
Semi-pilot Study of Electrokinetic Process for Phenanthrene Removal from Kaolinite

양지원, 한국지하수토양환경학회 2004년도 임시총회 및 추계학술발표회, pp.0 - 0, 한국지하수토양환경학회, 2004-09-01

174444
Semi-recursive VLSI architecture for two dimensional discrete wavelet transform

Pack, SK; Jeon, HK; Kim, Lee-Sup, Proceedings of the 1998 IEEE International Symposium on Circuits and Systems, ISCAS. Part 5 (of 6), pp.469 - 472, IEEE, 1998-05-31

174445
Semi-sequential 방법을 이용한 열교환망의 합성

박선원, KIChE Meeting, Spring, KIChE, 1999-01-01

174446
Semi-supervised active learning for 3D object detection using consistency based uncertainty = 일관성 기반 불확실성 추정을 사용한 3차원 객체검출 모델의 준지도 학습기반 능동학습 방법link

Hwang, Sihwan; Kum, Dongsuk; et al, 한국과학기술원, 2022

174447
Semi-supervised bearing fault diagnosis with adversarially trained phase-consistent network = 적대적 위상 일치 신경망을 사용한 준지도 베어링 이상 진단link

Yi, Jaehyuk; Park, Jinkyoo; et al, 한국과학기술원, 2021

174448
Semi-supervised Bearing Fault Diagnosis with Adversarially-Trained Phase-Consistent Network

Yi, Jaehyuk; Park, Jinkyoo, 27th ACM SIGKDD Conference on Knowledge Discovery and Data Mining, KDD 2021, pp.3875 - 3885, Association for Computing Machinery, 2021-08

174449
Semi-supervised Botnet Detection Using Ant Colony Clustering

Huseynov, Khalid; Kim, Kwangjo; Yoo, Paul D., SCIS2014, v.0, The Institute of Electronics, Information and Communication Engineers (IEICE), 2014-01-22

174450
Semi-Supervised Domain Adaptation for End-to-End Automatic Speech Recognition

Jeong, Hyeonjae; Goo, Jahyun; Kim, Seunghi; Kim, Hoi-Rin, SICSS 2019, pp.134, Korean Society of Speech Sciences, 2019-11-15

174451
Semi-Supervised Domain Adaptation via Selective Pseudo Labeling and Progressive Self-Training

Kim, Yoonhyung; Kim, Changick, ICPR: International Conference on Pattern Recognition, pp.1059 - 1066, IEEE, 2021-01-15

174452
Semi-Supervised Gait Generation With Two Microfluidic Soft Sensors

Kim, Dooyoung; Kim, Min; Kwon, Junghan; Park, Yong-Lae; Jo, Sungho, IEEE Robotics and Automation Letters, v.4, no.3, pp.2501 - 2507, 2019-07

174453
Semi-Supervised Hyperspectral Object Detection Challenge Results

Rangnekar, Aneesh; Mulhollan, Zachary; Vodacek, Anthony; Hoffman, Matthew; Sappa, Angel; Blasch, Erik; Yu, Jun; et al, 18th IEEE Workshop on Perception Beyond the Visible Spectrum, pp.390 - 398, Perception Beyond the Visible Spectrum IEEE PBVS2022, 2022-06-19

174454
Semi-supervised learning for simultaneous location detection and classification of mixed-type defect patterns in wafer bin maps = 웨이퍼 혼합 결함 패턴의 위치 탐지와 분류를 위한 준지도 학습link

Lee, Jaehyun; Kim, Heeyoung; et al, 한국과학기술원, 2022

174455
Semi-Supervised Learning for Simultaneous Location Detection and Classification of Mixed-Type Defect Patterns in Wafer Bin Maps

Lee, Hyuck; Lee, Jaehyun; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.36, no.2, pp.220 - 230, 2023-05

174456
Semi-Supervised Learning of Optical Flow by Flow Supervisor

Im, Woobin; Lee, Sebin; Yoon, Sung-eui, 2022 European Conference on Computer Vision (ECCV), pp.302 - 318, IEEE Computer Society and the Computer Vision Foundation (CVF), 2022-10-25

174457
Semi-supervised Learning Using Teacher-student Models for Vocal Melody Extraction

Keum, Sagneun; Lin, Jing-Hua; Su, Li; Nam, Juhan, The 21th International Society for Music Information Retrieval Conference (ISMIR), International Society for Music Information Retrieval, 2020-10-13

174458
Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps With Mixed-Type Defect Patterns

Lee, Hyuck; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.653 - 662, 2020-11

174459
Semi-supervised multi-label learning for classification of wafer bin maps with mixed-type defect patterns = 준지도 다중 라벨 학습을 이용한 혼합된 형태의 결함 패턴을 가진 반도체 웨이퍼 빈맵 분류link

Lee, Hyuck; Kim, Heeyoung; et al, 한국과학기술원, 2020

174460
Semi-supervised object detection with contrastive learning and regression uncertainty = 대조 학습 및 회귀 불확실성을 사용한 준지도 학습 기반의 객체 탐지link

Choi, Honggyu; Kim, Tae-Kyun; et al, 한국과학기술원, 2023

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