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Showing results 128761 to 128780 of 275509

128761
Microstructural changes of globules in calcium-silicate-hydrate gels with and without additives determined by small-angle neutron and X-ray scattering

Chiang, Wei-Shan; Fratini, Emiliano; Ridi, Francesca; Lim, Sung-Hwan; Yeh, Yi-Qi; Baglioni, Piero; Choi, Sung-Min; et al, JOURNAL OF COLLOID AND INTERFACE SCIENCE, v.398, pp.67 - 73, 2013-05

128762
Microstructural characteristic of alkali-activated fly ash exposed to CO2-rich environment

Park, SM; Jang, JG; Kim, GM; Lee, Haeng Ki, 11th Annual International Concrete Sustainability Conference (2016 ICSC), 11th Annual International Concrete Sustainability Conference (2016 ICSC), 2016-05-15

128763
Microstructural characteristics and crystallographic evolutions of Ga-doped ZnO films grown on sapphire substrates at high temperatures by RF magnetron sputtering

Lee, Ju-Ho; Kim, Young-Yi; Cho, Hyung-Koun; Lee, Jeong-Yong, JOURNAL OF CRYSTAL GROWTH, v.311, no.22, pp.4641 - 4646, 2009-11

128764
Microstructural characteristics and embrittlement phenomena in neutron irradiated 309L stainless steel RPV clad

Lee, JS; Kim, In Sup; Kasada, R; Kimura, A, JOURNAL OF NUCLEAR MATERIALS, v.326, no.1, pp.38 - 46, 2004-03

128765
Microstructural Characteristics and Embrittlement Phenomena in Type ER309L Stainless Steel with Neutron Irradiation

김인섭, Mechanical Behaviors of Materials, 2002

128766
Microstructural Characteristics and Mechanical Properties of a Mechanically Alloyed 15Cr ODS Ferritic Steel

사인진; 장창희; 김태규; 노상훈, 2013 춘계학술발표회, KNS, 2013-05-29

128767
Microstructural characteristics of geopolymers affecting damage and fracture mechanisms: an overview,

Kim, E.M.; Yang, B.J.; Lee, Haeng-Ki, The Second International Conference on Damage Mechanics (ICDM2), The Second International Conference on Damage Mechanics (ICDM2), 2015-07-08

128768
Microstructural Characteristics of Tin Oxide-Based Thin Films on (0001) Al2O3 Substrates: Effects of Substrate Temperature and RF Power During Co-Sputtering

Hwang, Sooyeon; Lee, Ju Ho; Kim, Young Yi; Yun, Myeong Goo; Lee, Kwan-Hun; Lee, JeongYong; Cho, Hyung Koun, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.14, no.12, pp.8908 - 8914, 2014-12

128769
Microstructural characterization and formation mechanism of 21 degrees top facets of ZnO-based nanowall structures

Lee, Ju-Ho; Kim, Dong-Chan; Kim, Sang-Yun; Choi, Sung-Soon; Lee, Kwan-Hun; Lee, Jeong-Yong; Cho, Hyung-Koun, PHYSICA B-CONDENSED MATTER, v.412, pp.12 - 16, 2013-03

128770
Microstructural characterization at the interface of Al2O3/ZnO/Al2O3 thin films grown by atomic layer deposition

Jang, Yong-Woon; Bang, Seok-Hwan; Jeon, Hyeong-Tag; Lee, Jeong-Yong, PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, v.248, no.7, pp.1634 - 1638, 2011-07

128771
Microstructural characterization for phase change and damage of cement-based materials using ultrasonic waves = 초음파를 이용한 콘크리트의 미세구조 정량화link

Yim, Hong-Jae; 임홍재; et al, 한국과학기술원, 2013

128772
Microstructural Characterization in Rotated Double-Layer Graphene Using Transmission Electron Microscopy

Lee, JeongYong; Yuk, Jong Min; Jeong, HY; Lee, MJ; Kim, NY; Lee, ZH, 2013 Materials Research Society Spring Meeting, Materials Research Society, 2013-04-03

128773
Microstructural Characterization of Additively Manufactured Metal Components Using Linear and Nonlinear Ultrasonic Techniques

Park, Seong-Hyun; Choi, Sungho; Song, Dong-Gi; Jhang, Kyung-Young, MATERIALS, v.15, no.11, 2022-06

128774
Microstructural Characterization of Clad Interface in Welds of Ni-Cr-Mo High Strength Low Alloy Steel

Kim, Hong-Eun; Lee, Ki-Hyoung; Kim, Min-Chul; Lee, Ho-Jin; Kim, Keong-Ho; Lee, Chang-Hee, KOREAN JOURNAL OF METALS AND MATERIALS, v.49, no.8, pp.628 - 634, 2011

128775
Microstructural characterization of heterointerfaces in MOCVD grown InGaAs/GaAs strained-layer system using cross section transmission electron micros

Park, M. C.; Park, HyoHoon; Kwon, O. J., Inst. Phys. the Royal Microscopical Society Conference: Microscopy of Semiconducting Materials 1993, pp.481 - 484, 1993-04-05

128776
Microstructural Characterization of High Indium-Composition InXGa1-XN Epilayers Grown on c-Plane Sapphire Substrates

Jeong, Myoungho; Lee, Hyo Sung; Han, Seok Kyu; Eun-Jung-Shin; Hong, Soon-Ku; Lee, JeongYong; Park, Yun Chang; et al, MICROSCOPY AND MICROANALYSIS, v.19, pp.145 - 148, 2013-08

128777
Microstructural characterization of InGaN/GaN MQWs with different quantum well number

Lee, Jeong Yong, The 10th Korean Conference on Semiconductors, pp.759 - 760, 2003-02-01

128778
Microstructural characterization of InGaN/GaN multiple quantum wells with high indium composition

Cho, HK; Lee, JeongYong; Kim, CS; Yang, GM; Sharma, N; Humphreys, C, JOURNAL OF CRYSTAL GROWTH, v.231, no.4, pp.466 - 473, 2001-11

128779
Microstructural characterization of nonpolar ZnO films grown on sapphire substrates by plasma-assisted molecular beam epitaxy = 분자선 에피탁시법으로 사파이어 기판 위에 성장된 비극성 ZnO 박막의 미세구조 특성 연구link

Lee, Jae-Wook; 이재욱; et al, 한국과학기술원, 2010

128780
Microstructural characterization of polycrystalline Si films grown by vapor-induced crystallization of amorphous Si using Al/Ni chloride

Eom, Ji Hye; Lee, Kye Ung; Ahn, Byung Tae, JOURNAL OF THE ELECTROCHEMICAL SOCIETY, v.154, no.3, pp.194 - 197, 2007

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