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Showing results 1 to 9 of 9

1	A study on the formation mechanism of ytterbium silicide for Schottky contact applications Na, Sekwon; Choi, Hwayoul; Lee, Byunghoon; Choi, Juyun; Seo, Yujin; Kim, Hyoungsub; Lee, Seok-Heeresearcher; et al, SURFACE AND INTERFACE ANALYSIS, v.44, no.11-12, pp.1497 - 1502, 2012-11
2	Al-induced crystallization of an amorphous Si thin film in a polycrystalline Al/native SiO2/amorphous Si structure Kim, JH; Lee, JeongYongresearcher, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.35, no.4A, pp.2052 - 2056, 1996-04
3	Combining structural and chemical information at the nanometer scale by correlative transmission electron microscopy and atom probe tomography Herbig, Michael; Choi, Pyuck-Paresearcher; Raabe, Dierk, ULTRAMICROSCOPY, v.153, pp.32 - 39, 2015-06
4	Interface Properties of Nickel-silicide Films Deposited by Using Plasma-assisted Atomic Layer Deposition Lee, Kwang-Man; Kim, Chang Young; Choi, Chi Kyu; Yun, Sang-Won; Ha, Jong-Bong; Lee, Jung-Hee; Lee, JeongYongresearcher, JOURNAL OF THE KOREAN PHYSICAL SOCIETY, v.55, no.3, pp.1153 - 1157, 2009-09
5	MBE growth of wurtzite GaN on LaAlO3 (100) substrate Lee, JJ; Park, YS; Yang, CS; Kim, HS; Kim, KH; Kang, KY; Kang, TW; et al, JOURNAL OF CRYSTAL GROWTH, v.213, no.1-2, pp.33 - 39, 2000-05
6	Observation of oxygen substitution in polycrystalline $Cu_2ZnSnSe_4$ thin films by high resolution electron microscopy and geometric phase analysis = 다결정체 $Cu_2ZnSnSe_4$ 박막에서 고분해능 전자현미경과 기하학 상분석을 이용한 산소치환 관찰 link Kim, Jin Hyun; 김진현; et al, 한국과학기술원, 2016
7	Phase separation and stacking fault of InxGa1-xN layers grown on thick GaN and sapphire substrate by metalorganic chemical vapor deposition Cho, HK; Lee, JeongYongresearcher; Kim, KS; Yang, GM, JOURNAL OF CRYSTAL GROWTH, v.220, no.3, pp.197 - 203, 2000-12
8	TEM을 이용한 L10 FePt (001) 자성박막의 미세조직과 자기적 특성에 관한 연구 = A study of the microstructure and the magnetic property of L10 FePt (001) magnetic thin film using TEM link 김아람; Kim, A-Ram; et al, 한국과학기술원, 2014
9	The structure of MCM-48 determined by electron crystallography Carlsson, A; Kaneda, M; Sakamoto, Y; Terasaki, O; Ryoo, Ryongresearcher; Joo, SH, JOURNAL OF ELECTRON MICROSCOPY, v.48, no.6, pp.795 - 798, 1999

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