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Fluorine Effects Originating from the CVD W Process on Charge-Trap Flash Memory Cells Moon, Jung Min; Lee, Tae Yoon; Ahn, Hyunjun; Lee, Tae In; Hwang, Wan Sik; Cho, Byung-Jin, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.66, no.1, pp.378 - 382, 2019-01 |
Influences of Mo substitution by W on the precipitation kinetics of secondary phases and the associated localized corrosion and embrittlement in 29% Cr ferritic stainless steels Park, CJ; Ahn, MK; Kwon, Hyuk-Sang, MATERIALS SCIENCE AND ENGINEERING A-STRUCTURAL MATERIALS PROPERTIES MICROSTRUCTURE AND PROCESSING, v.418, pp.211 - 217, 2006-02 |
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