Browse by Subject threshold defect behavior

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Quantitative Observation of Threshold Defect Behavior in Memristive Devices with Operando X-ray Microscopy

Liu, Huajun; Dong, Yongqi; Cherukara, Mathew J.; Sasikumar, Kiran; Narayanan, Badri; Cai, Zhonghou; Lai, Barry; et al, ACS NANO, v.12, no.5, pp.4938 - 4945, 2018-05

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