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Carrier Lifetime Extension via the Incorporation of Robust Hole/Electron Blocking Layers in Bulk Heterojunction Polymer Solar Cells Yoon, Youngwoon; Kim, Hyeongjun; Cho, Chul Hee; Kim, Seulki; Son, Hae Jung; Ko, Min-Jae; Kim, Honggon; et al, ACS APPLIED MATERIALS INTERFACES, v.6, no.1, pp.333 - 339, 2014-01 |
Intrinsic reduction of ballistic hole current due to quantum mechanical coupling of heavy and light holes in p-type Si nanowire field effect transistors Shin, Mincheol, APPLIED PHYSICS LETTERS, v.99, no.14, 2011-10 |
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