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Microstructural Effects on Nickel Oxide Film Properties in an Infrared Electrochromic Window for Shutter-Less Infrared Sensor Application Shim, Hyun Bin; Kim, Woo Young; Kang, In-Ku; Lee, Hee Chul, IEEE SENSORS JOURNAL, v.17, no.20, pp.6522 - 6528, 2017-10 |
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