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EFFECTS OF ELECTRON-BEAM DAMAGE ON THE ELECTRICAL CHARACTERISTICS OF N-TYPE METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT-TRANSISTORS Park, Sin Chong, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, v.33, no.3A, pp.1223 - 1227, 1994 |
HYDROGENATION EFFECT IN AN N-CHANNEL METAL-OXIDE-SEMICONDUCTOR FIELD-EFFECT TRANSISTOR LEE, CH; Lee, Choochon; Chang, Kee-Joo; KIM, SC; JANG, J, APPLIED PHYSICS LETTERS, v.58, no.2, pp.134 - 136, 1991-01 |
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