Showing results 1 to 5 of 5
Applications of an Instantaneous Damage Detection Technique to Plates with Additional Complexities Kim, Seung Bum; Lee, Chang Gil; Hong, Jung-Wuk; Park, Hyun Woo; Sohn, Hoon, JOURNAL OF NONDESTRUCTIVE EVALUATION, v.29, no.3, pp.189 - 205, 2010-09 |
Computational Study on the Performance of Si Nanowire pMOSFETs Based on the k . p Method Shin, Mincheol; Lee, S; Klimeck, G, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.57, no.9, pp.2274 - 2283, 2010-09 |
Quantum Mechanical Simulation of Hole Transport in p-Type Si Schottky Barrier MOSFETs Choi, Wonchul; Shin, Mincheol, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.11, pp.5861 - 5864, 2011-07 |
Quantum transport of holes in 1D, 2D, and 3D devices: the k center dot p method Shin, Mincheol, JOURNAL OF COMPUTATIONAL ELECTRONICS, v.10, no.1-2, pp.44 - 50, 2011-06 |
직교 이방성 무한평판 내부의 원공주위 균열 해석(直交 異方性 無限平版 內部의 圓孔周圍 龜裂 解析) Cheong, S.K.; Hong, C.S., 대한기계학회논문집 A, v.11, no.6, pp.895 - 903, 1987-11 |
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