Browse by Subject B segregation

Showing results 1 to 3 of 3

Ab initio study of boron segregation and deactivation at Si/SiO2 interface

Oh, Young-Jun; Hwang, Jin-Heui; Noh, Hyeon-Kyun; Bang, Jun-Hyeok; Ryu, Byung-Ki; Chang, Kee-Jooresearcher, MICROELECTRONIC ENGINEERING, v.89, pp.120 - 123, 2012-01

First-principles study of boron-related defects in $SiO_2$ and boron segregation at the $Si/SiO_2$ interface = Bulk $SiO_2$ 내에서의 붕소결함과 $Si/SiO_2$ 계면에서의 붕소응집에 관한 제일원리 연구link

Hwang, Jin-Heui; 황진희; et al, 한국과학기술원, 2011

First-principles study of the segregation of boron dopants near the interface between crystalline Si and amorphous SiO2

Oh, Young-Jun; Noh, Hyeon-Kyun; Chang, Kee-Jooresearcher, PHYSICA B-CONDENSED MATTER, v.407, no.15, pp.2989 - 2992, 2012-08

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