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Transmission electron microscopy study of SiF+/BF2+ implanted and annealed (100)Si: Amorphization and residual effects Kim, JH; Lee, JeongYongresearcher; Paik, JC; Kim, HJ, JOURNAL OF APPLIED PHYSICS, v.79, no.10, pp.7549 - 7554, 1996-05 |
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