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Simultaneous Measurement of Thickness and Permittivity by Means of the Resonant Frequency Fitting of a Microstrip Line Ring Resonator Lim, Sungmook; Kim, Choul-Young; Hong, Songcheol, IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, v.28, no.6, pp.539 - 541, 2018-06 |
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