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Characterization of CeO2 thin films as insulator of metal ferroelectric insulator semiconductor (MFIS) structures Song, HW; Lee, CS; Kim, DG; No, Kwangsoo, THIN SOLID FILMS, v.368, no.1, pp.61 - 66, 2000 |
Determination of Work Function of Graphene under a Metal Electrode and Its Role in Contact Resistance Song, Seung Min; Park, Jong Kyung; Sul, One Jae; Cho, Byung Jin, NANO LETTERS, v.12, no.8, pp.3887 - 3892, 2012-08 |
Enhancement of the stability of capacitance-voltage characteristics of Hg1-xZnxTe-based metal-insulator-semiconductor capacitors by voltage annealing Kim, Y.H; Kim, S.H, JAPANESE JOURNAL OF APPLIED PHYSICS PART 2-LETTERS & EXPRESS LETTERS, v.43, no.10A, pp.L1244 - L1246, 2004-10 |
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