Showing results 1 to 2 of 2
GPU-accelerated white-light scanning interferometer for large-area, high-speed surface profile measurements You, Joonho; KIM, Young-Jin; Kim, Seung-Woo, INTERNATIONAL JOURNAL OF NANOMANUFACTURING, v.8, no.1-2, pp.31 - 39, 2012-01 |
멀티레터레이션에 근거한 점회절을 이용한 대영역 표면형상 측정 = Large scale surface profile measurement using point diffraction based on multilaterationlink 김병창; Kim, Byoung-Chang; et al, 한국과학기술원, 2003 |
Discover