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Electrical Characterization of n/p-Type Nickel Silicide/Silicon Junctions by Sb Segregation Jun, Myungsim; Park, Youngsam; Hyun, Younghoon; Choi, Sung-Jin; Jang, Moongyu; Zyung, Taehyung, JOURNAL OF NANOSCIENCE AND NANOTECHNOLOGY, v.11, no.8, pp.7339 - 7342, 2011 |
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