Showing results 1 to 2 of 2
Analysis of Drain-Induced Barrier Rising in Short-Channel Negative-Capacitance FETs and Its Applications Seo, Junbeom; Lee, Jaehyun; Shin, Mincheol, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.64, no.4, pp.1793 - 1798, 2017-04 |
Quantum transport simulation study of negative capacitance FETs based on the Landau theory and its applications = Landau 이론 기반 NCFET 소자의 양자 수송 전산모사를 통한 소자 특성 연구와 응용link Seo, Junbeom; 서준범; et al, 한국과학기술원, 2016 |
Discover