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Showing results 1 to 3 of 3

1
Investigation of Leaky Characteristic in a Single-Transistor-Based Leaky Integrate-and-Fire Neuron

Han, Joon-Kyu; Kim, Myung-Su; Kim, Seung-Il; Lee, Mun-Woo; Lee, Sang-Won; Yu, Ji-Man; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.68, no.11, pp.5912 - 5915, 2021-11

2
Low-Frequency Noise Characteristics Under the OFF-State Stress

Lee, Geon-Beom; Kim, Choong-Ki; Yoo, Min-Soo; Choi, Yang-Kyu, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.67, no.10, pp.4366 - 4371, 2020-10

3
Off-state leakage in MOSFET considering source/drain extension regions

Hur, Jae; Jeong, Woo Jin; Shin, Mincheol; Choi, Yang-Kyu, SEMICONDUCTOR SCIENCE AND TECHNOLOGY, v.36, no.8, pp.085018, 2021-08

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