Browse by Subject 분포 외 결함패턴▼a불확실성▼a분류▼a심층 학습▼a반도체 제조 공정▼a웨이퍼 빈 맵
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| Classification and out-of-distribution detection for wafer bin maps = 웨이퍼 결함 패턴 분류 및 분포 외 패턴 탐지link Choi, Jeongman; Kim, Heeyoung; et al, 한국과학기술원, 2023 |
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