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Analysis of heavy-metal ions using mercury microelectrodes and a solid-state reference electrode on a Si wafer Yun, KS; Kim, HJ; Joo, S; Kwak, Juhyoun; Yoon, E, JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES REVIEW PAPERS, v.39, no.12B, pp.7159 - 7163, 2000-12 |
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