Showing results 1 to 1 of 1
DETERMINATION OF THE DENSITY-OF-STATES AT THE FERMI-LEVEL OF HYDROGENATED AMORPHOUS-SILICON IN THIN-FILM-TRANSISTOR STRUCTURE BY SPACE-CHARGE LIMITED CURRENT MEASUREMENT h. s. soh; j. jang; m. y. jung; s. s. yoo; Choochon Lee, APPLIED PHYSICS LETTERS, v.63, no.6, pp.779 - 781, 1993 |
Discover