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Showing results 1 to 5 of 5

1
On-machine surface profile metrology for Polishing large-scale Opitcs

Khim, H.; Park, J.; Kwon, T.; You, J.; Kim, Seung-Woo, The 2nd International Conference on Positioning Technology, pp.141 - 145, 2006

2
Optical inspection of complex patterns of microelectronics products

You, J.; Kim, Seung-Woo, CIRP ANNALS-MANUFACTURING TECHNOLOGY, v.57, no.1, pp.505 - 508, 2008

3
Point diffraction interferometer with vibratinn desensitizing Capability

You, J.; Park, J.; Kwon, T.; Khim, H.; Kim, Seung-Woo, KAIST-NMIJ Joint Workshop 2006 on Precision Metrology, pp.29 -, 2006-12

4
Understanding topological mesoscale features in community mining

Moon, Sue Bok; You, J.; Kwak, H.; Kim, D.; Jeong, H., 2010 2ND INTERNATIONAL CONFERENCE ON COMMUNICATION SYSTEMS AND NETWORKS, v.0, no.0, pp.0 - 0, 2010

5
Vibration-desensitized fiber-diffraction interferometer for industrial surface measurements

Park, J.; You, J.; Kim, Seung-Woo, CIRP ANNALS-MANUFACTURING TECHNOLOGY, v.58, no.1, pp.473 - 476, 2009

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