Showing results 1 to 11 of 11
A High Speed Unified-RAM (URAM) Cell Multi-Functioning Capacitorless DRAM and NVM Choi, Yang-Kyu; Han, J.-W.; Ryu, S.-W.; Kim, C.; Kim, S.-H.; Im, M.; Choi, S. J.; et al, IEEE International Electron Device Meeting, pp.929 - 932, 2007-12 |
Band Offset FinFET-Based URAM (Unified-RAM) Built on SiC for Multi-Functioning NVM and Capacitorless 1T-DRAM Choi, Yang-Kyu; Han, JW; Ryu, SW; Kim, SH; Chungjin Kim; Kim, C; Ann, JH; et al, 28th IEEE Symposium on VLSI Technology, pp.200 - 201, 123, 2008-06 |
Combined optical interferometer for displacement measurement Joo, KN; Oh, JS; KIM SEUNG WOO, 한국정밀공학회 한일심포지움, pp.324 - 327, 2003-11-27 |
Compensation of Parasitic Motion Errors in Translational Stage Based on Twyman-Green Interferometry Oh, JS; Bae, ED; Kim, Seung-Woo, JSPE, pp.433 - 434, 2004-06 |
Enhancement of high temperature data retention by La2O3-doped nitride for charge-trap type flash memory device Park, JK; Park, Y; Lee, Seok-Hee; Lim, SK; Oh, JS; Joo, MS; Hong, K; et al, 제18회 한국반도체학술대회, 한국물리학회 반도체분과회, 한국재료학회, 대한전기학회 전기재료 연구회, 2011-02 |
Femtosecond laser pulses for surface-profile metrology Oh, JS; Kim, Seung-Woo, OPTICS LETTERS, v.30, no.19, pp.2650 - 2652, 2005-10 |
Simultaneous Measurement and Compensation of 5-DOF Motion Errors Using Extended Twyman-Green Interferometry Oh, JS; Bae, ED; Kim, Seung-Woo, EUSPEN, pp.314 - 315, 2004-05-06 |
Synthesis and ionic conductivities of lithium-doped morpholinium salts Choi, SJ; Kim, KS; Lee, Huen; Oh, JS; Lee, BB, KOREAN JOURNAL OF CHEMICAL ENGINEERING, v.22, no.2, pp.281 - 284, 2005-03 |
The Analysis and Compensation of 2D Position Error in Scanning Type XY Stage Oh, JS; Bae, ED; Kim, Seung-Woo, JSPE, pp.231 - 233, 2004-06 |
The KSTAR project: An advanced steady state superconducting tokamak experiment Lee, GS; Kim, J; Hwang, SM; Chang, Choong-Seock; Chang, Hong-Young; Cho, MH; Choi, BH; et al, NUCLEAR FUSION, v.40, pp.575 - 582, 2000-03 |
Thermal and electrochemical properties of ionic liquids based on N-methyl-N-alkyl morpholinium cations Choi, S; Kim, KS; Cha, JH; Lee, Huen; Oh, JS; Lee, BB, KOREAN JOURNAL OF CHEMICAL ENGINEERING, v.23, no.5, pp.795 - 799, 2006-09 |
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