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Showing results 1 to 6 of 6

1
A search for evidence of strain gradient hardening in Au submicron pillars under uniaxial compression using synchrotron X-ray micro diffraction

Budiman, AS; Han, Seung Min J.; Greer, JR; Tamura, N; Patel, JR; Nix, WD, ACTA MATERIALIA, v.56, no.3, pp.602 - 608, 2008-02

2
An analysis technique for extraction of thin film stresses from x-ray data

Cornella, G; Lee, Seok-Hee; Nix, WD; Bravman, JC, APPLIED PHYSICS LETTERS, v.71, no.20, pp.2949 - 2951, 1997-11

3
Combinatorial studies of mechanical properties of Ti-Al thin films using nanoindentation

Han, Seung Min J.; Shah, R; Banerjee, R; Viswanathan, GB; Clemens, BM; Nix, WD, ACTA MATERIALIA, v.53, no.7, pp.2059 - 2067, 2005-04

4
Determining hardness of thin films in elastically mismatched film-on-substrate systems using nanoindentation

Han, Seung Min J.; Saha, R; Nix, WD, ACTA MATERIALIA, v.54, no.6, pp.1571 - 1581, 2006-04

5
Novel Size and Surface Oxide Effects in Silicon Nanowires as Lithium Battery Anodes

McDowell, MT; Lee, SW; Ryu, Ill; Wu, H; Nix, WD; Choi, Jang Wook; Cui, Y, NANO LETTERS, v.11, no.9, pp.4018 - 4025, 2011-09

6
Size effects on strength and plasticity of vanadium nanopillars

Han, Seung Min J.; Bozorg-Grayeli, T; Groyes, JR; Nix, WD, SCRIPTA MATERIALIA, v.63, no.12, pp.1153 - 1156, 2010-12

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