Showing results 1 to 1 of 1
Scalable in-memory clustered annealer with temporal noise of FinFET for the travelling salesman problem Lu, Anni; Choi, Yang-Kyu; Hur, Jae; Luo, Yuan-Chun; Li, Hai; Nikonov, Dmitri; Young, Ian; et al, 68th IEEE International Electron Devices Meeting, IEDM 2022, IEEE, 2022-12-03 |
Discover