Showing results 1 to 3 of 3
A digital TCXO with new trimming method Hyungcheol Shin; Minkyu Je; Kyungmi Lee, TELECOMMUNICATIONS REVIEW, no.6, 2000-12 |
A Simple Technique to Measure Generation Lifetime in Partially Depleted SOI MOSFET's Hyungcheol Shin; M. Racanelli; W.M.Huang; J. Foerstner; Seokjin Choi; D.K.Schroder, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.45, no.11, pp.2378 - 2380, 1998-11 |
Plasma Charging Damage During Over-Etch Time of Aluminum Hyungcheol Shin; Geunsook Park; Chenming Hu, SOLID-STATE ELECTRONICS, v.42, no.6, pp.911 - 913, 1998-06 |
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