Browse by Author Hwang, Kyu-Man

Showing results 1 to 6 of 6

1
A Comprehensive Study of a Single-Transistor Latch in Vertical Pillar-Type FETs With Asymmetric Source and Drain

Lee, Seung-Wook; Kim, Seong-Yeon; Hwang, Kyu-Man; Jin, Ik Kyeong; Hur, Jae; Kim, Dohyun; Son, Jun Woo; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.11, pp.5208 - 5212, 2018-11

2
Comprehensive Study on the Relation Between Low-Frequency Noise and Asymmetric Parasitic Resistances in a Vertical Pillar-Type FET

Lee, Seung-Wook; Bang, Tewook; Kim, Choong-Ki; Hwang, Kyu-Man; Jang, Byung Chul; Moon, Dong-Il; Bae, Hagyoul; et al, IEEE ELECTRON DEVICE LETTERS, v.38, no.8, pp.1008 - 1011, 2017-08

3
First Demonstration of a Logic-process Compatible Junctionless Ferroelectric FinFET Synapse for Neuromorphic Applications

Seo, Myungsoo; Kang, Min Ho; Jeon, Seung-Bae; Bae, Hagyoul; Hur, Jae; Jang, Byung Chul; Yun, Seokjung; et al, IEEE ELECTRON DEVICE LETTERS, v.39, no.9, pp.1445 - 1448, 2018-09

4
Multilevel States of Nano-Electromechanical Switch for a PUF-Based Security Device

Hwang, Kyu-Man; Kim, Wu-Kang; Jin, Ik Kyeong; Lee, Seung-Wook; Choi, Yang-Kyu, SMALL, v.15, no.3, 2019-01

5
Nano-electromechanical Switch Based on a Physical Unclonable Function for Highly Robust and Stable Performance in Harsh Environments

Hwang, Kyu-Man; Park, Jun-Young; Bae, Hagyoul; Lee, Seung-Wook; Kim, Choong-Ki; Seo, Myungsoo; Im, Hwon; et al, ACS NANO, v.11, no.12, pp.12547 - 12552, 2017-12

6
Quantitative Analysis of Deuterium Annealing Effect on Poly-Si TFTs by Low Frequency Noise and DC I-V Characterization

Kim, Dohyun; Lim, Sung Kwan; Bae, Hagyoul; Kim, Choong-Ki; Lee, Seung-Wook; Seo, Myungsoo; Kim, Seong-Yeon; et al, IEEE TRANSACTIONS ON ELECTRON DEVICES, v.65, no.4, pp.1640 - 1644, 2018-04

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