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Return-Volatility Relationship in High Frequency Data: Multiscale Horizon Dependency Lee, Jihyun; Kim, Tong Suk; Lee, Hoe Kyung, STUDIES IN NONLINEAR DYNAMICS AND ECONOMETRICS, v.15, no.1, 2011 |
Risk-Return Relationship in High Frequency Data: Multiscale Analysis and Long Memory Lee, Jihyun; Kim, Tong Suk; Lee, Hoe Kyung, KAIST Business School Working Paper Series KBS-WP-2008-007, 2008-05 |
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