Showing results 1 to 1 of 1
Improvement of Minority Carrier Life Time in N-type Monocrystalline Si by the Czochralski Method Baik, Sungsun; Pang, Ilsun; Kim, Jaemin; Kim, Kwanghun, ELECTRONIC MATERIALS LETTERS, v.12, no.4, pp.426 - 430, 2016-07 |
Discover