Showing results 6 to 6 of 6
The effect of ZrO2 buffer layer on electrical properties in Pt/SrBi2Ta2O9/ZrO2/Si ferroelectric gate oxide structure Choi, HS; Kim, EH; Choi, IH; Kim, YT; Choi, JH; Lee, JeongYong, THIN SOLID FILMS, v.388, no.1-2, pp.226 - 230, 2001-06 |
Discover