Showing results 44 to 52 of 52
Semi-Supervised Multi-Label Learning for Classification of Wafer Bin Maps With Mixed-Type Defect Patterns Lee, Hyuck; Kim, Heeyoung, IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING, v.33, no.4, pp.653 - 662, 2020-11 |
Semisupervised Training of Deep Generative Models for High-Dimensional Anomaly Detection Xie, Qin; Zhang, Peng; Yu, Boseon; Choi, Jaesik, IEEE TRANSACTIONS ON NEURAL NETWORKS AND LEARNING SYSTEMS, v.33, no.6, pp.2444 - 2453, 2022-06 |
Short-Term Electrical Load Forecasting With Multidimensional Feature Extraction Kim, Nakyoung; Park, Hyunseo; Lee, Joohyung; Choi, Jun Kyun, IEEE TRANSACTIONS ON SMART GRID, v.13, no.4, pp.2999 - 3013, 2022-07 |
Survival Analysis of COVID-19 Patients With Symptoms Information by Machine Learning Algorithms Kim, Gwangsu; Yoo, Chang-Dong; Yang, Seong J., IEEE ACCESS, v.10, pp.62282 - 62291, 2022 |
Towards Interoperability of Entity-Based and Event-Based IoT Platforms: The Case of NGSI and EPCIS Standards Tolcha, Yalew; Kassahun, Ayalew; Montanaro, Teodoro; Conzon, Davide; Schwering, Georg; Maselyne, Jarissa; Kim, Daeyoung, IEEE ACCESS, v.9, pp.49868 - 49880, 2021-04 |
Unsupervised Domain Adaptation for 3D Point Clouds by Searched Transformations Kang, Dongmin; Nam, Yeongwoo; Kyung, Daeun; Choi, Jonghyun, IEEE ACCESS, v.10, pp.56901 - 56913, 2022 |
Utilizing Skipped Frames in Action Repeats for Improving Sample Efficiency in Reinforcement Learning Luu, Tung M.; Nguyen, Thanh; Vu, Thang; Yoo, Chang-Dong, IEEE ACCESS, v.10, pp.64965 - 64975, 2022 |
Value-Based Constraint Control Flow Integrity Jung, Dongjae; 김민수; Jang, Jinsoo; Kang, Brent Byunghoon, IEEE ACCESS, v.8, pp.50531 - 50542, 2020-03 |
Weak Detection in the Spiked Wigner Model Chung, Hye Won; Lee, Ji Oon, IEEE TRANSACTIONS ON INFORMATION THEORY, v.68, no.11, pp.7427 - 7453, 2022-11 |
Discover