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Sub-Bandgap Photonic Capacitance-Voltage Method for Characterization of the Interface Traps in Low Temperature Poly-Silicon Thin-Film Transistors Hwang, Jun Seok; Bae, Hagyoul; Lee, Jungmin; Choi, Sung-Jin; Kim, Dae Hwan; Kim, Dong Myong, IEEE ELECTRON DEVICE LETTERS, v.36, no.4, pp.339 - 341, 2015-04 |
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