Showing results 7 to 9 of 9
Lateral resolution enhancement in confocal self-interference microscopy with commercial calcite plate Kang, DK; Yoo, HK; Lee, SW; Gweon Dae Gab, 2nd International Symposium on Nano-manufacturing, 2004-11-03 |
Measuring PSFs for Fluorescence Nanoscopy Gweon Dae Gab; Yoo, HK; Song, IC, Nanoengineering Symposium 2005, 2005-10-28 |
Vibration analysis of Atomic Force Microscopy Gweon Dae Gab, Proceeding of the Korean Society for Noise and Vibration Engineering, 2000-09 |
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