Showing results 73741 to 73760 of 109579
Scanning electron and field emission microscopy of supported metal clusters Castro, T; Li, YZ; Reifenberger, R; Choi, E; Park, SeungBin; Andres, RP, ACS Symposium Series 437, pp.329 - 341, ACS Symposium, 1990 |
Scanning MEMS Grating for Micro-spectrometer application Jeon, Jaehoon; Jeong, Ki-Hun; Ahn, Myeong-Su; Park, Jung Woo; Kim, Gi Beom, SPIE ABC 2021(Annual Biophotonics Conference 2021), Optical Society of Korea, SPIE, 2021-11-05 |
Scanning Parameter Optimization for Inspectation of Wedling Defects in X-ray Linear Laminography Park, Miran; Lee, Minju; Kim, Giyoon; Hwang, Sun-Uk; Kim, Hyean Dock; Cho, Seungryong; Cho, Gyuseong, International confernece on Thermoelectrics (ICT), International confernece on Thermoelectrics (ICT), 2017-08-01 |
Scanning Parameter Optimization for Inspection of Wedling Defects in X-ray Linear Laminography Park, Miran; Lee, Minju; Kim, Kiyoon; Hwang, Sun-Uk; Jin, Sang Young; Kim, Hyunduk; Cho, Seungryong; et al, iCT2017 - 7th International Conference on Industrial Computed Tomography, iCT, 2017-02-08 |
Scanning Probe Microscopy을 이용한 +c 단분역 구조를 갖는 Heteroepitaxial PbTiO3 박막에서의 Retension Loss 현상 연구 최시경; 안우송; 정원웅; Cho, Yasuo, 한국세라믹학회, 2005 |
Scanning Road Surface for Preview System using Ultrasonic Sensors 김민현; 최세범, 2016 한국자동차공학회 춘계학술대회, 한국자동차공학회, 2016-05-20 |
Scanning Seebeck Microscope Simulations Based on the heat and Electron Transport 김용현; 이의섭; 조상희; 여호기, 2014 KIAS Electronic Structure Workshop, 고등과학원, 2014-06-19 |
Scanning Seebeck Microscope Simulations Bsed on the Heat and Electron Transport Lee, Eui-Sup; Kim, Yong-Hyun, 17th Asian Workshop on First-Principles Electronic Structure Calculations, Yonsei University, 2014-11-04 |
Scanning Thermoelectric Microscopywith Atomic Resolution: SeebeckEffect at the Atomic Scale Kim, Yong-Hyun; Lee, Eui Sup; Cho, Sanghee; Kang, Stephen Dongmin; Kim, Wondong; Woo,Sung-Jae; Kong, Ki-Jeong; et al, 제 10회 표면나노과학 워크샵, 원자제어 저차원 전자계 연구단, 2014-02-07 |
Scanning time reduction based on adaptive threshold in hierarchical cellular networks Byung-Ik Jung; Moon, Jung-Min; Cho, Dong-Ho, IEEE 20th Personal, Indoor and Mobile Radio Communications Symposium, PIMRC 2009, pp.2861 - 2865, IEEE, 2009-09-13 |
Scanning Tunneling Microscopy Studies on Water-Intercalated CVD Graphene on Mica Hwang, Jin Heui; Lee, Hyun Soo; Kim, Wondong; Park, Jeong Young, 한국물리힉회 2015년 봄학술논문발표회 및 정기총회, 한국물리학회, 2015-04-23 |
Scanning Tunneling Microscopy Studies on Water-Intercalated Graphene Hwang, Jin Heui; Lee, Hyun Soo; Kim, Woondong; Park, Jeong Young, 2015 MRS Spring Meeting & Exhibit, Materials Research Society, 2015-04-09 |
Scanning Tunneling Microscopy Study of Silver upon Au (111) in the Presence of Chloride Lee, Joohan; Hwang, Seongpil; Kwak, Juhyoun, 201th The Electrochemical Society Meeting, ECS Centennial Meeting, pp.500 - 500, 2002 |
Scanning-based pre-processing for enhanced RFID tag anti-collision protocols Choi, J.H.; Lee, D.; Youn, Y.; Jeon, H.; Lee, HyuckJae, 2006 International Symposium on Communications and Information Technologies, ISCIT, pp.1207 - 1211, IEEE, 2006-10-18 |
Scanpath Analysis with Fixation Maps to Provide Factors for Natural Gaze Control Yoo, Bum Soo; Kim, Jong-Hwan, The 2nd International Conference on Robot Intelligence Technology and Applications (RITA), Korea Robot Soccer Association, 2013-12-19 |
ScanShot: Detecting Document Capture Moments and Correcting Device Orientation Oh, Jeung Min; Choi, Woo Hyeok; Kim, Joo Hyun; Lee, Ui Chin, ACM SIGCHI Conference on Human Factors in Computing Systems (CHI), pp.953 - 956, ACM Special Interest Group on Computer-Human Interaction (SIGCHI), 2015-04-20 |
SCARA 형 D.D. 로보트를 위한 복합재료 팔의 최적 Winding 각도 계산 Yoon Keun Kwak, 한국복합재료학회, pp.43 - 49, 1988-05-01 |
SCARA형 로보트팔에 대한 최적설계의 응용 곽윤근; 강봉수; 김수현, 대한기계학회 추계학술대회, v.2, no.1, pp.639 - 643, 대한기계학회, 1992 |
SCARA형 로봇트를 위한 프로그래밍 시스템 변증남, 1987年度 電氣ㆍ電子工學 學術大會, pp.275 - 278, 1987 |
ScarfNet: Multi-scale Features with Deeply Fused and Redistributed Semantics for Enhanced Object Detection Yoo, JinHyeok; Kum, Dongsuk; Choi, JunWon, International Conference on Pattern Recognition (ICPR), pp.4506 - 4512, IEEE, 2021-01-15 |
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