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Showing results 29321 to 29340 of 276408

29321
Analysis of M/G/1 queues with disasters = Disaster가 존재하는 M/G/1 모형의 분석link

Kim, Jin-Dong; 김진동; et al, 한국과학기술원, 1999

29322
Analysis of M/G/1 stochastic clearing systems

Yang, WS; Kim, JD; Chae, Kyung-Chul, STOCHASTIC ANALYSIS AND APPLICATIONS, v.20, no.5, pp.1083 - 1100, 2002-09

29323
Analysis of M/G/c queues with multiple vacations using the supplementary variable technique = 부가 변수법에 의한 복수 휴가형 M/G/c 모형의 분석link

Yi, Xeung-Won; 이승원; et al, 한국과학기술원, 2003

29324
Analysis of Magnetic Dipole Moment for a 300-W Solar-Cell Array

Shin, Goo-Hwan; Kim, Dong-Guk; Kwon, Se-Jin; Lee, Hu-Seung, JOURNAL OF ASTRONOMY AND SPACE SCIENCES, v.36, no.3, pp.181 - 186, 2019-09

29325
Analysis of Magnetic Energy Harvester for Inspection Robot of Power Line Using Saturable Inductor

PARK, BUMJIN; HUH, SUNGRYUL; Kim, Dongwook; Brito Calderon, Andres Santiago; Shin, Yujun; Park, Jaehyoung; Koo, Ja-il; et al, IEEE Wireless Power Transfer Conference (WPTC), Institute of Electrical and Electronics Engineers Inc., 2020-11-18

29326
Analysis of magnetic polarizability of two circular apertures in a thick conducting plane = 두꺼운 도체판의 두 원형 개구면이 갖는 자기 분극률 해석link

Zeong, Jong-Wook; 정종욱; et al, 한국과학기술원, 2001

29327
Analysis of magnetic tunnel junction-based spin-torque oscillator using NEGF-LLGS calculation = NEGF-LLGS 계산을 통한 자기터널접합 기반 스핀 발진소자의 분석link

Noh, Seongcheol; 노성철; et al, 한국과학기술원, 2016

29328
Analysis of Magnetization Reversal in Magnetic Tunnel Junctions with Self-consistent Calculation

Noh, Seong Cheol; Shin, Min Cheol, 2015 Asia-Pacific Workshop on Fundamentals and Applications of Advanced Semiconductor Devices (AWAD), IEICE, IEIE, 2015-06-29

29329
Analysis Of Magneto-Optical Spectra Of Magnetic Materials Using Modified Effective Medium Theory

You, CY; Shin, Sung-Chul, MORIS'96, pp.149 -, MORIS, 1996

29330
Analysis of mass concrete structures with concrete properties by thermal stress device - part II: verification

Cha, Sang-Lyul; Jin, Seung-Seop; Kim, Jin-Keun, MAGAZINE OF CONCRETE RESEARCH, v.72, no.8, pp.392 - 411, 2020-04

29331
Analysis of Measured Single-Hop Delay from an Operational Backbone Network

Papagiannaki, Konstantina; Moon, Sue Bok; Fraleigh, Chuck; Thiran, Patrick; Tobagi, Fouad A.; Diot, Christophe, 21st Annual Joint Conference of the IEEE-Computer-and-Communications-Societies, pp.533 - 544, IEEE Communications Society, 2002-06

29332
Analysis of mechanical behavior of ultra-fine Au wires by micro-tensile test technique

Hong, Soon Hyung, pp.82 - 92, 2002-01-01

29333
Analysis of Mechanical Characteristics of Polymer Sandwich Panels Containing Injection Molded and 3D Printed Pyramidal Kagome Cores

Yang, K. M.; Park, J. H.; Choi, T. G.; Hwang, J. S.; Yang, Dong-Yol; Lyu, M. -Y., ELASTOMERS AND COMPOSITES, v.51, no.4, pp.275 - 279, 2016-12

29334
Analysis of Mechanical Joint in Composite Cylinder

Hong, Chang Sun, Proc. of the 30th Aircraft Symposium, pp.236 - 239, 1992

29335
Analysis of Mechanical Properties Degradation of Li[NixCoyMnz]O2 Cathode for Li-ion batteries

한승민, 대한금속재료학회 2016춘계, 대한금속재료학회, 2016-04-28

29336
Analysis of Mechanical Properties Degradation of Li[NixCoyMnz]O2 Cathode for Li-ion batteries

Han, Seung Min Jane, 대한금속재료학회 2016 춘계, 대한금속재료학회, 2016-04-28

29337
Analysis of mechanical properties for biofilm in a microfluidic device (poster)

Lim, Seongjin; Kim, Seunggyu; Jeon, Jessie Sungyun, 대한기계학회 2016년도 학술대회, 대한기계학회, 2016-12-14

29338
Analysis of Mechanical Properties of Polymer ABC by Atomic Force Microscopy

김성철, 한국고분자학회 추계발표회, 2005

29339
Analysis of mechanism of contaminant removal from a bottom river cavity

Chang, K.S.; Constantinescu, G.; Park, Seung O, World water and environmental resources congress, 2006-05

29340
Analysis of Medical Devices EMC Problems due to Leakage Magnetic Field generated in Wireless Charging System of Electric Vehicle

Rhee, Jaewon; Ahn, Jangyong; Kim, Haerim; Lee, Changmin; Ahn, Seungyoung, 35th General Assembly and Scientific Symposium of the International Union of Radio Science, URSI GASS 2023, Institute of Electrical and Electronics Engineers Inc., 2023-08-25

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